Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Lyman, C. E., Lifshin, E., . . . Michael, J. R. (2003). Scanning electron microscopy and X-Ray microanalysis (Third edition.). [New York]: Springer.

Goldstein, Joseph I.,, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, and Joseph R. Michael. Scanning Electron Microscopy and X-Ray Microanalysis. Third edition. [New York]: Springer, 2003.

Goldstein, Joseph I.,, et al. Scanning Electron Microscopy and X-Ray Microanalysis. Third edition. [New York]: Springer, 2003.