Scanning electron microscopy and X-Ray microanalysis - Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C., 1943-; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. ([New York] : Springer, 2003)
Keywords: MICROSCOPIOS; MICROSCOPIA ELECTRÓNICA; RAYOS X