Scanning electron microscopy and x-ray microanalysis - Echlin, Patrick; Goldstein, Joseph I.; Joy, David C.; Lifshin, Eric; Lyman, Charles E.; Michael, Joseph R.; Newbury, Dale E.; Sawyer, Linda (New York : Springer, 2003)
ELEC
Keywords: Microscopía electrónica; Radiografías; Rayos X; Microanálisis; libros