APA Citation

AITKEN, R. C. NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.

Chicago Style Citation

AITKEN, ROBERT C. NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.

MLA Citation

AITKEN, ROBERT C. NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.

Warning: These citations may not always be 100% accurate.