Cita APA

AITKEN, R. C. NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.

Citación estilo Chicago

AITKEN, ROBERT C. NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.

Cita MLA

AITKEN, ROBERT C. NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.

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