Sandak, J., Negri, M., Orlowski,Kazimiers, & Tanaka, C. Thickness monitoring of thin lamellae by optical measurement method.
Chicago Style CitationSandak, Jakub, Martino Negri, Orlowski,Kazimiers, and Chiaki Tanaka. Thickness Monitoring of Thin Lamellae By Optical Measurement Method.
MLA CitationSandak, Jakub, Martino Negri, Orlowski,Kazimiers, and Chiaki Tanaka. Thickness Monitoring of Thin Lamellae By Optical Measurement Method.
Warning: These citations may not always be 100% accurate.