Cita APA

Sandak, J., Negri, M., Orlowski,Kazimiers, & Tanaka, C. Thickness monitoring of thin lamellae by optical measurement method.

Citación estilo Chicago

Sandak, Jakub, Martino Negri, Orlowski,Kazimiers, y Chiaki Tanaka. Thickness Monitoring of Thin Lamellae By Optical Measurement Method.

Cita MLA

Sandak, Jakub, Martino Negri, Orlowski,Kazimiers, y Chiaki Tanaka. Thickness Monitoring of Thin Lamellae By Optical Measurement Method.

Precaución: Estas citas no son 100% exactas.