CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test - Pavlov, Andrei; Sachdev, Manoj; SpringerLink (Online service) (Dordrecht : Springer Netherlands : Imprint: Springer, 2008)
and Motivation -- SRAM Circuit Design and Operation -- SRAM Cell Stability: Definition, Modeling and Testing -- Traditional SRAM Fault Models and Test Practices -- Techniques for Detection of SRAM Cells with Stability Faults -- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.
Keywords: Electronic circuits; Computer memory systems; Circuits and Systems; Memory Structures