Acoustic Scanning Probe Microscopy - Marinello, Francesco; Passeri, Daniele; Savio, Enrico; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013)
From the contents: Overview of acoustic techniques -- Contact dynamics modelling -- Cantilever dynamics: theoretical modeling -- Finite elements modelling -- AFAM calibration -- Enhanced sensitivity -- UAFM -- Holography calibration -- UFM -- Friction/lateral techniques -- Harmonix -- Scanning microdeformation microscopy (SMM) -- Tip wear -- Comparison with other techniques -- Applications polymer -- Thin films.
Keywords: Lasers; Photonics; Nanotechnology; Acoustics; Materials science; Materials-Surfaces.; Thin films; Optics, Lasers, Photonics, Optical Devices; Nanotechnology and Microengineering; Acoustics; Nanotechnology; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films