APA Citation

Tan, C. M., & He, F. (2013). Electromigration Modeling at Circuit Layout Level (1st ed. 2013.). Singapore: Springer Singapore : Imprint: Springer.

Chicago Style Citation

Tan, Cher Ming., and Feifei He. Electromigration Modeling At Circuit Layout Level. 1st ed. 2013. Singapore: Springer Singapore : Imprint: Springer, 2013.

MLA Citation

Tan, Cher Ming., and Feifei He. Electromigration Modeling At Circuit Layout Level. 1st ed. 2013. Singapore: Springer Singapore : Imprint: Springer, 2013.

Warning: These citations may not always be 100% accurate.