Cita APA

Tan, C. M., & He, F. (2013). Electromigration Modeling at Circuit Layout Level (1st ed. 2013.). Singapore: Springer Singapore : Imprint: Springer.

Citación estilo Chicago

Tan, Cher Ming., y Feifei He. Electromigration Modeling At Circuit Layout Level. 1st ed. 2013. Singapore: Springer Singapore : Imprint: Springer, 2013.

Cita MLA

Tan, Cher Ming., y Feifei He. Electromigration Modeling At Circuit Layout Level. 1st ed. 2013. Singapore: Springer Singapore : Imprint: Springer, 2013.