Electromigration Modeling at Circuit Layout Level - Tan, Cher Ming.; He, Feifei; SpringerLink (Online service) (Singapore : Springer Singapore : Imprint: Springer, 2013)
Introduction -- 3D Circuit Model Construction and Simulation -- Comparison of EM Performance in Circuit Structure and Test Structure -- Interconnect EM Reliability Modeling at Circuit Layout Level -- Conclusion.
Keywords: Quality control; Reliability; Industrial safety; Electronic circuits; Atoms; Physics; Quality Control, Reliability, Safety and Risk; Electronic Circuits and Devices; Atomic, Molecular, Optical and Plasma Physics