Extreme Statistics in Nanoscale Memory Design - Singhee, Amith; Rutenbar, Rob A.; SpringerLink (Online service) (New York, NY : Springer US : Imprint: Springer, 2010)
Extreme Statistics in Memories -- Statistical Nano CMOS Variability and Its Impact on SRAM -- Importance Sampling-Based Estimation: Applications to Memory Design -- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics -- Yield Estimation by Computing Probabilistic Hypervolumes -- Most Probable Point-Based Methods -- Extreme Value Theory: Application to Memory Statistics.
Keywords: Electronic circuits; Electronics; Microelectronics; Circuits and Systems; Electronics and Microelectronics, Instrumentation