Design, Analysis and Test of Logic Circuits Under Uncertainty - Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P.; SpringerLink (Online service) (Dordrecht : Springer Netherlands : Imprint: Springer, 2013)
Introduction -- Probabilistic Transfer Matrices -- Computing with Probabilistic Transfer Matrices -- Testing Logic Circuits for Probabilistic Faults -- Signtaure-based Reliability Analysis -- Design for Robustness -- Summary and Extensions.
Keywords: Electronic circuits; Arithmetic and logic units, Computer; Computer hardware; Computer software-Reusability.; Logic design; Computer science-Mathematics.; Circuits and Systems; Arithmetic and Logic Structures; Computer Hardware; Performance and Reliability; Logic Design; Symbolic and Algebraic Manipulation