Design for Manufacturability and Statistical Design : A Constructive Approach - Orshansky, Michael; Nassif, Sani.; Boning, Duane; SpringerLink (Online service) (New York, NY : Springer US : Imprint: Springer, 2008)
Sources of Variability -- Front End Variability -- Back End Variability -- Environmental Variability -- Variability Characterization and Analysis -- Test Structures For Variability -- Statistical Foundations Of Data Analysis And Modeling -- Design Techniques for Systematic Manufacturability Problems -- Lithography Enhancement Techniques -- Ensuring Interconnect Planarity -- Statistical Circuit Design -- Statistical Circuit Analysis -- Statistical Static Timing Analysis -- Leakage Variability And Joint Parametric Yield -- Parametric Yield Optimization -- Conclusions.
Keywords: Electronic circuits; Computer-aided engineering; Industrial engineering; Production engineering; Electrical engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Industrial and Production Engineering; Electrical Engineering