Measurements, Modelling and Simulation of Dynamic Systems - Layer, Edward; Tomczyk, Krzysztof; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010)
to Measuring Systems -- Sensors -- Methods of Noise Reduction -- Model Development -- Mapping Error.
Keywords: Applied mathematics; Engineering mathematics; Electronics; Microelectronics; Artificial intelligence; Computers; Mathematical and Computational Engineering; Electronics and Microelectronics, Instrumentation; Artificial Intelligence; Information Systems and Communication Service