Cita APA

Breitenstein, O., Warta, W., & Langenkamp, M. (2010). Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (2nd ed. 2010.). Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer.

Citación estilo Chicago

Breitenstein, Otwin., Wilhelm Warta, y Martin Langenkamp. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. 2nd ed. 2010. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2010.

Cita MLA

Breitenstein, Otwin., Wilhelm Warta, y Martin Langenkamp. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. 2nd ed. 2010. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2010.