Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials - Breitenstein, Otwin; Warta, Wilhelm; Langenkamp, Martin; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010)
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
Keywords: Lasers; Photonics; Materials science; Engineering; Structural materials; Optics, Lasers, Photonics, Optical Devices; Characterization and Evaluation of Materials; Engineering, general; Structural Materials