Abu Rahma, M., & Anis, M. (2013). Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield (1st ed. 2013.). New York, NY: Springer New York : Imprint: Springer.
Citación estilo ChicagoAbu Rahma, Mohamed., y Mohab Anis. Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield. 1st ed. 2013. New York, NY: Springer New York : Imprint: Springer, 2013.
Cita MLAAbu Rahma, Mohamed., y Mohab Anis. Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield. 1st ed. 2013. New York, NY: Springer New York : Imprint: Springer, 2013.
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