Nanometer Variation-Tolerant SRAM : Circuits and Statistical Design for Yield - Abu Rahma, Mohamed; Anis, Mohab; SpringerLink (Online service) (New York, NY : Springer New York : Imprint: Springer, 2013)
Introduction -- Variability in Nanometer Technologies and Impact on SRAM -- Variarion-Tolerant SRAM Write and Read Assist Techniques -- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control -- A Methodology for Statistical Estimation of Read Access Yield in SRAMs -- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.
Keywords: Electronic circuits; Computer-aided engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design