Reliability Physics and Engineering : Time-To-Failure Modeling - McPherson, J. W.; SpringerLink (Online service) (Cham : Springer International Publishing : Imprint: Springer, 2013)
Introduction -- Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics - An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-To-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB) -- Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering -- Conversion of Dynamical Stresses Into Effective Static Values -- Increasing the Reliability of Device/Product Designs -- Screening -- Heat Generation and Dissipation -- Sampling Plans and Confidence Intervals -- Appendix A: Useful Conversion Factors -- Appendix B: Useful Physical Constants -- Appendix C: Useful Rough Rules-Of-Thumb -- Appendix D: Useful Mathematical Expressions -- Appendix E: Useful Differentials and Definite Integrals -- Appendix F: Free-Energy -- Appendix G: t(1-α/2,ν) Distribution Values -- Appendix H: χ2(P,ν) Distribution Values -- Index.
Keywords: Electronics; Microelectronics; Quality control; Reliability; Industrial safety; Statistics .; Energy; Electronics and Microelectronics, Instrumentation; Quality Control, Reliability, Safety and Risk; Statistical Theory and Methods; Energy, general