Reliability Physics and Engineering : Time-To-Failure Modeling - McPherson, J. W.; SpringerLink (Online service) (New York, NY : Springer US : Imprint: Springer, 2010)
Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics - An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-to-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- Conversion of Dynamical Stresses into Effective Static Values -- Increasing the Reliability of Device/Product Designs -- Erratum to: Materials and Device Degradation.
Keywords: Quality control; Reliability; Industrial safety; Electronics; Microelectronics; Mechanical engineering; Quality Control, Reliability, Safety and Risk; Electronics and Microelectronics, Instrumentation; Mechanical Engineering