Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick; Nicolici, Nicola; Wen, Xiaoqing; SpringerLink (Online service) (New York, NY : Springer US : Imprint: Springer, 2010)
Fundamentals of VLSI Testing -- Power Issues During Test -- Low-Power Test Pattern Generation -- Power-Aware Design-for-Test -- Power-Aware Test Data Compression and BIST -- Power-Aware System-Level Test Planning -- Low-Power Design Techniques and Test Implications -- Test Strategies for Multivoltage Designs -- Test Strategies for Gated Clock Designs -- Test of Power Management Structures -- EDA Solution for Power-Aware Design-for-Test.
Keywords: Electronic circuits; Computer-aided engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design