System-Level Validation : High-Level Modeling and Directed Test Generation Techniques - Chen, Mingsong; Qin, Xiaoke; Koo, Heon-Mo.; Mishra, Prabhat; SpringerLink (Online service) (New York, NY : Springer New York : Imprint: Springer, 2013)
Introduction -- Modeling and Specification of SoC Designs -- Automated Generation of Directed Tests -- Functional Test Compaction.- Property Clustering and Learning Techniques -- Decision Ordering Based Learning Techniques -- Synchronized Generation of Directed Tests -- Learning-Oriented Property Decomposition Approaches -- Directed Test Generation for Multicore Architectures -- Test Generation for Cache Coherence Validation.- Reuse of System-Level Tests for Implementation Validation -- Conclusion.
Keywords: Electronic circuits; Electronics; Microelectronics; Microprocessors; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Processor Architectures