VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers - Kaushik, Brajesh Kumar; Dasgupta, Sudeb; Singh, Virendra; SpringerLink (Online service) (Singapore : Springer Singapore : Imprint: Springer, 2017)
Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification.
Keywords: Computer hardware; Microprocessors; Computer communication systems; Computer Hardware; Processor Architectures; Computer Communication Networks