Klapetek, P. (2013). Quantitative data processing in scanning probe microscopy: Spm applications for nanometrology. Estados Unidos: William Andrew Publishing.
Chicago Style CitationKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology. Estados Unidos: William Andrew Publishing, 2013.
MLA CitationKlapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology. Estados Unidos: William Andrew Publishing, 2013.
Warning: These citations may not always be 100% accurate.