Cita APA

Klapetek, P. (2013). Quantitative data processing in scanning probe microscopy: Spm applications for nanometrology. Estados Unidos: William Andrew Publishing.

Citación estilo Chicago

Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology. Estados Unidos: William Andrew Publishing, 2013.

Cita MLA

Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: Spm Applications for Nanometrology. Estados Unidos: William Andrew Publishing, 2013.