Nanometer Technology Designs High-Quality Delay Tests - Ahmed, Nisar; SpringerLink (Online service) (New York, NY : Springer US : Imprint: Springer, 2008)
Introduction to path delay and transition delay fault models and test methods -- At-speed test challenges for nanometer technology designs -- Low-cost tester friendly design-for-test techniques -- Improving test quality of current at-speed test methods -- Functionally untestable fault list generation and avoidance -- Timing-based ATPG for screening small delay faults -- Faster-than-at-speed test considering IR-drop effects -- IR-drop tolerant at-speed test pattern generation and application.
Keywords: Electronic circuits; Electronics; Microelectronics; Computer-aided engineering; Nanotechnology; Electrical engineering; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology; Electrical Engineering