Transmission Electron Microscopy A Textbook for Materials Science - Williams, David B.; Carter, C. Barry; SpringerLink (Online service) (New York, NY : Springer US : Imprint: Springer, 2009)
Basics -- The Transmission Electron Microscope -- Scattering and Diffraction -- Elastic Scattering -- Inelastic Scattering and Beam Damage -- Electron Sources -- Lenses, Apertures, and Resolution -- How to 'See' Electrons -- Pumps and Holders -- The Instrument -- Specimen Preparation -- Diffraction -- Diffraction in TEM -- Thinking in Reciprocal Space -- Diffracted Beams -- Bloch Waves -- Dispersion Surfaces -- Diffraction from Crystals -- Diffraction from Small Volumes -- Obtaining and Indexing Parallel-Beam Diffraction Patterns -- Kikuchi Diffraction -- Obtaining CBED Patterns -- Using Convergent-Beam Techniques -- Imaging -- Amplitude Contrast -- Phase-Contrast Images -- Thickness and Bending Effects -- Planar Defects -- Imaging Strain Fields -- Weak-Beam Dark-Field Microscopy -- High-Resolution TEM -- Other Imaging Techniques -- Image Simulation -- Processing and Quantifying Images -- Spectrometry -- X-ray Spectrometry -- X-ray Spectra and Images -- Qualitative X-ray Analysis and Imaging -- Quantitative X-ray Analysis -- Spatial Resolution and Minimum Detection -- Electron Energy-Loss Spectrometers and Filters -- Low-Loss and No-Loss Spectra and Images -- High Energy-Loss Spectra and Images -- Fine Structure and Finer Details.
Keywords: Materials science; Nanotechnology; Solid state physics; Spectroscopy; Microscopy; Mechanics; Mechanics, Applied; Characterization and Evaluation of Materials; Nanotechnology; Solid State Physics; Spectroscopy and Microscopy; Solid Mechanics