Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK - Cullis, A.G.; Midgley, P.A.; SpringerLink (Online service) (Dordrecht : Springer Netherlands : Imprint: Springer, 2008)
Wide Band-Gap Nitrides -- General Heteroepitaxial Layers -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device and Doping Studies -- FIB, SEM and SPM Advances.
Keywords: Materials science; Solid state physics; Spectroscopy; Microscopy; Physical measurements; Measurement .; Electronics; Microelectronics; Materials Science, general; Solid State Physics; Spectroscopy and Microscopy; Measurement Science and Instrumentation; Electronics and Microelectronics, Instrumentation