Noncontact Atomic Force Microscopy Volume 2 - Morita, Seizo; Giessibl, Franz J.; Wiesendanger, Roland; SpringerLink (Online service) (Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009)
Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
Keywords: Nanotechnology; Spectroscopy; Microscopy; Mechanics; Mechanics, Applied; Engineering; Condensed matter; Nanotechnology and Microengineering; Spectroscopy and Microscopy; Theoretical and Applied Mechanics; Nanotechnology; Engineering, general; Condensed Matter Physics