Test Pattern Generation using Boolean Proof Engines - Drechsler, Rolf.; Eggersglüß, Stephan; Fey, Görschwin.; Tille, Daniel; SpringerLink (Online service) (Dordrecht : Springer Netherlands : Imprint: Springer, 2009)
Preliminaries -- Boolean Satisfiability -- SAT-Based ATPG -- Learning Techniques -- Multiple-Valued Logic -- Improved Circuit-to-CNF Conversion -- Branching Strategies -- Integration into Industrial Flow -- Delay Faults -- Summary and Outlook.
Keywords: Electronic circuits; Electronics; Microelectronics; Circuits and Systems; Electronics and Microelectronics, Instrumentation