Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital systems testing and testable design. New York, New York: IEEE.
Chicago Style CitationAbramovici, Miron, Melvin A. Breuer, and Arthur D. Friedman. Digital Systems Testing and Testable Design. New York, New York: IEEE, 1990.
MLA CitationAbramovici, Miron, Melvin A. Breuer, and Arthur D. Friedman. Digital Systems Testing and Testable Design. New York, New York: IEEE, 1990.
Warning: These citations may not always be 100% accurate.