Cita APA

Ohshima, H., & Furusawa, K. (1998). Electrical phenomena at interfaces: Fundamentals, measurements, and applications (2. edición rev. and expanded.). New York, New York: M. Dekker.

Citación estilo Chicago

Ohshima, Hiroyuki, y Kunio Furusawa. Electrical Phenomena At Interfaces: Fundamentals, Measurements, and Applications. 2. edición rev. and expanded. New York, New York: M. Dekker, 1998.

Cita MLA

Ohshima, Hiroyuki, y Kunio Furusawa. Electrical Phenomena At Interfaces: Fundamentals, Measurements, and Applications. 2. edición rev. and expanded. New York, New York: M. Dekker, 1998.