Ohshima, H., & Furusawa, K. (1998). Electrical phenomena at interfaces: Fundamentals, measurements, and applications (2. edición rev. and expanded.). New York, New York: M. Dekker.
Chicago Style CitationOhshima, Hiroyuki, and Kunio Furusawa. Electrical Phenomena At Interfaces: Fundamentals, Measurements, and Applications. 2. edición rev. and expanded. New York, New York: M. Dekker, 1998.
MLA CitationOhshima, Hiroyuki, and Kunio Furusawa. Electrical Phenomena At Interfaces: Fundamentals, Measurements, and Applications. 2. edición rev. and expanded. New York, New York: M. Dekker, 1998.
Warning: These citations may not always be 100% accurate.