Reith, A., & Mayhew, T. M. (1988). Stereology and morphometry in electron microscopy: Problems and solutions. New York, New York: Hemisphere.
Chicago Style CitationReith, Allbrecht, and Terry M. Mayhew. Stereology and Morphometry in Electron Microscopy: Problems and Solutions. New York, New York: Hemisphere, 1988.
MLA CitationReith, Allbrecht, and Terry M. Mayhew. Stereology and Morphometry in Electron Microscopy: Problems and Solutions. New York, New York: Hemisphere, 1988.
Warning: These citations may not always be 100% accurate.