Cita APA

Reith, A., & Mayhew, T. M. (1988). Stereology and morphometry in electron microscopy: Problems and solutions. New York, New York: Hemisphere.

Citación estilo Chicago

Reith, Allbrecht, y Terry M. Mayhew. Stereology and Morphometry in Electron Microscopy: Problems and Solutions. New York, New York: Hemisphere, 1988.

Cita MLA

Reith, Allbrecht, y Terry M. Mayhew. Stereology and Morphometry in Electron Microscopy: Problems and Solutions. New York, New York: Hemisphere, 1988.