Characterization of epitarial semiconductor films /
Autor principal: | Kressel, Henry (Editor ) |
---|---|
Formato: | Libro |
Lenguaje: | English |
Publicado: |
Amsterdam :
Elsevier Scientific,
1976.
|
Colección: | Methods nad phenomena. Their applications in science and technology ;
v. 2) |
Materias: |
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