Compatibility and testing of electronic components /

Compatibility and testing of electronic components /

Bibliographic Details
Main Author: Jowett, Charles Eric (Author, Autor/a)
Format: Book
Language:English
Published: New York, New York : J. Wiley, 1972.
Subjects:
CIRCUITOS INTEGRADOS
Description
Physical Description:345 páginas : ilustraciones ; 23 cm
ISBN:047045170X

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