Ramírez Porras, A., & Ramírez Porras, A. Nanostructure size determination in n+-type porous silicon by X-ray diffractormetry and Raman spectroscopy.
Citación estilo ChicagoRamírez Porras, Arturo, y Arturo Ramírez Porras. Nanostructure Size Determination in N+-type Porous Silicon By X-ray Diffractormetry and Raman Spectroscopy.
Cita MLARamírez Porras, Arturo, y Arturo Ramírez Porras. Nanostructure Size Determination in N+-type Porous Silicon By X-ray Diffractormetry and Raman Spectroscopy.
Precaución: Estas citas no son 100% exactas.