Cita APA

Fearn, S. (2015). An introduction to time-of-flight secondary Ion Mass Spectrometry (ToF-SIMS) and its application to materials science. San Rafael, California: Morgan & Claypool Publishers.

Citación estilo Chicago

Fearn, Sarah. An Introduction to Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science. San Rafael, California: Morgan & Claypool Publishers, 2015.

Cita MLA

Fearn, Sarah. An Introduction to Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Its Application to Materials Science. San Rafael, California: Morgan & Claypool Publishers, 2015.