Accelerating test, validation and debug of high speed serial interfaces /

Accelerating test, validation and debug of high speed serial interfaces /

Bibliographic Details
Main Author: Fan, Yongquan (Autor/a)
Other Authors: Zilic, Zeljko (Autor/a)
Format: Book
Language:English
Published: New York : Springer, c2011.
Series:Accelerating test, validation and debug of high speed serial interfaces
Subjects:
CIRCUITOS DE INTERFAZ > PRUEBAS
CIRCUITOS INTEGRADOS > PRUEBAS
Online Access:Ver documento en línea

Internet

Ver documento en línea

Sistema de Bibliotecas de Universidad de Costa Rica

Holdings details from Sistema de Bibliotecas de Universidad de Costa Rica
Call Number: 621.381.548
Copy Available

Similar Items