Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S. 1., & Virazel, A. 1. (2010). Advanced test methods for SRAMs: Effective solutions for dynamic fault detection in nanoscaled technologies. New York, N.Y.: Springer.

Bosio, Alberto, Luigi Dilillo, Patrick Girard, Serge 1957- Pravossoudovitch, and Arnaud 1974- Virazel. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. New York, N.Y.: Springer, 2010.

Bosio, Alberto, et al. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. New York, N.Y.: Springer, 2010.