Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies. - Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge 1957-; Virazel, Arnaud 1974- (New York, N.Y. : Springer, 2010)
Keywords: ALMACENAMIENTO VIRTUAL (COMPUTACION); DISPOSITIVOS DE ALMACENAMIENTO (COMPUTADORAS)