Cita APA

(2014). Design-for-test and test optimization techniques for TSV-based 3D stacked ICs.

Citación estilo Chicago

Design-for-test and Test Optimization Techniques for TSV-based 3D Stacked ICs. 2014.

Cita MLA

Design-for-test and Test Optimization Techniques for TSV-based 3D Stacked ICs. 2014.

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