Goldstein, J. I. 1., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning electron microscopy and X-Ray microanalysis (fourth edition.). New York: Springer.

Goldstein, Joseph I. 1939, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. Scanning Electron Microscopy and X-Ray Microanalysis. fourth edition. New York: Springer, 2018.

Goldstein, Joseph I. 1939, et al. Scanning Electron Microscopy and X-Ray Microanalysis. fourth edition. New York: Springer, 2018.