Echlin, P., Goldstein, J. I., Joy, D. C., Lifshin, E., Lyman, C. E., Michael, J. R., . . . Sawyer, L. (2003). Scanning electron microscopy and x-ray microanalysis (3 edition.). New York: Springer.

Echlin, Patrick, Joseph I. Goldstein, David C. Joy, Eric Lifshin, Charles E. Lyman, Joseph R. Michael, Dale E. Newbury, and Linda Sawyer. Scanning Electron Microscopy and X-ray Microanalysis. 3 edition. New York: Springer, 2003.

Echlin, Patrick, et al. Scanning Electron Microscopy and X-ray Microanalysis. 3 edition. New York: Springer, 2003.