Zhang, H., Jayas, D. S., Paliwal, J., & White, N. D. G. Classification of fungal infected wheat kernels using near - infrared reflectance hyperspectral imaging and support vector machine.
Citación estilo ChicagoZhang, H., D. S. Jayas, J. Paliwal, y N. D. G. White. Classification of Fungal Infected Wheat Kernels Using Near - Infrared Reflectance Hyperspectral Imaging and Support Vector Machine.
Cita MLAZhang, H., D. S. Jayas, J. Paliwal, y N. D. G. White. Classification of Fungal Infected Wheat Kernels Using Near - Infrared Reflectance Hyperspectral Imaging and Support Vector Machine.
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