Compact Modeling : Principles, Techniques and Applications /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Gildenblat, Gennady. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Materias:
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020 |a 9789048186143 
024 7 |a 10.1007/978-90-481-8614-3  |2 doi 
040 |a Sistema de Bibliotecas del TEC 
245 1 0 |a Compact Modeling :  |b Principles, Techniques and Applications /  |c edited by Gennady Gildenblat. 
250 |a 1st ed. 2010. 
260 # # |a Dordrecht :  |b Springer Netherlands :  |b Imprint: Springer,  |c 2010. 
300 |a XVII, 527 p. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
505 0 |a Compact Models of MOS Transistors -- Surface-Potential-Based Compact Model of Bulk MOSFET -- PSP-SOI: A Surface-Potential-Based Compact Model of SOI MOSFETs -- Benchmark Tests for MOSFET Compact Models -- High-Voltage MOSFET Modeling -- Physics of Noise Performance of Nanoscale Bulk MOS Transistors -- Compact Models of Bipolar Junction Transistors -- to Bipolar Transistor Modeling -- Mextram -- The HiCuM Bipolar Transistor Model -- Compact Models of Passive Devices -- Integrated Resistor Modeling -- The JUNCAP2 Model for Junction Diodes -- Surface-Potential-Based MOS Varactor Model -- Modeling of On-chip RF Passive Components -- Modeling of Multiple Gate MOSFETs -- Multi-Gate MOSFET Compact Model BSIM-MG -- Compact Modeling of Double-Gate and Nanowire MOSFETs -- Statistical Modeling -- Modeling of MOS Matching -- Statistical Modeling Using Backward Propagation of Variance (BPV). 
650 0 |a Electronic circuits. 
650 1 4 |a Circuits and Systems. 
700 1 |a Gildenblat, Gennady.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks