Evolution of Thin Film Morphology : Modeling and Simulations /

Detalles Bibliográficos
Autores principales:	Pelliccione, Matthew. (Autor), Lu, Toh-Ming. (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	eBook
Lenguaje:	English
Publicado:	New York, NY : Springer New York : Imprint: Springer, 2008.
Edición:	1st ed. 2008.
Colección:	Springer Series in Materials Science, 108
Materias:	Materials—Surfaces. Thin films. Optical materials. Electronic materials. Tribology. Corrosion and anti-corrosives. Coatings. Surfaces and Interfaces, Thin Films. Optical and Electronic Materials. Tribology, Corrosion and Coatings.

Descripción
Descripción Física:	XII, 206 p. : online resource.
ISBN:	9780387751092

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