Electron Backscatter Diffraction in Materials Science /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Schwartz, Adam J. (Editor ), Kumar, Mukul. (Editor ), Adams, Brent L. (Editor ), Field, David P. (Editor )
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 2009.
Edición:2nd ed. 2009.
Materias:
LEADER 03079nam a22003615i 4500
001 000282485
005 20211101143329.0
007 cr nn 008mamaa
008 101014s2009 xxu| s |||| 0|eng d
020 |a 9780387881362 
024 7 |a 10.1007/978-0-387-88136-2  |2 doi 
040 |a Sistema de Bibliotecas del Tecnológico de Costa Rica 
245 1 0 |a Electron Backscatter Diffraction in Materials Science /  |c edited by Adam J. Schwartz, Mukul Kumar, Brent L. Adams, David P. Field. 
250 |a 2nd ed. 2009. 
260 # # |a New York, NY :  |b Springer US :  |b Imprint: Springer,  |c 2009. 
300 |a XXII, 403 p. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
505 0 |a Present State of Electron Backscatter Diffraction and Prospective Developments -- Dynamical Simulation of Electron Backscatter Diffraction Patterns -- Representations of Texture -- Energy Filtering in EBSD -- Spherical Kikuchi Maps and Other Rarities -- Application of Electron Backscatter Diffraction to Phase Identification -- Phase Identification Through Symmetry Determination in EBSD Patterns -- Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM -- Collection, Processing, and Analysis of Three-Dimensional EBSD Data Sets -- 3D Reconstruction of Digital Microstructures -- Direct 3D Simulation of Plastic Flow from EBSD Data -- First-Order Microstructure Sensitive Design Based on Volume Fractions and Elementary Bounds -- Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations -- Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool -- Grain Boundary Networks -- Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections -- Strain Mapping Using Electron Backscatter Diffraction -- Mapping and Assessing Plastic Deformation Using EBSD -- Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques -- Application of EBSD Methods to Severe Plastic Deformation (SPD) and Related Processing Methods -- Applications of EBSD to Microstructural Control in Friction Stir Welding/Processing -- Characterization of Shear Localization and Shock Damage with EBSD -- Texture Separation for ?/? Titanium Alloys -- A Review of In Situ EBSD Studies -- Electron Backscatter Diffraction in Low Vacuum Conditions -- EBSD in the Earth Sciences: Applications, Common Practice, and Challenges -- Orientation Imaging Microscopy in Research on High Temperature Oxidation. 
650 0 |a Materials science. 
650 0 |a Condensed matter. 
650 0 |a Geophysics. 
650 1 4 |a Characterization and Evaluation of Materials. 
650 2 4 |a Materials Science, general. 
650 2 4 |a Condensed Matter Physics. 
650 2 4 |a Geophysics/Geodesy. 
700 1 |a Schwartz, Adam J.  |e editor. 
700 1 |a Kumar, Mukul.  |e editor. 
700 1 |a Adams, Brent L.  |e editor. 
700 1 |a Field, David P.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks